Hilo Semiconductor (Xuzhou) Co., Ltd.

IC Programming equipment · IC Programming equipment

IC Programming equipment · IC Programming equipment

IC Test Socket
IC Test Socket
IC Test Socket

Programming and Testing Equipment

IC Test Socket
describe
We offer a full range of IC test sockets designed to meet demanding applications such as semiconductor testing, programming and burn-in, providing highly customizable and reliable connection solutions for everything from standard testing to high-temperature environments, and from automated production lines to R&D validation.
Core Service Offerings
Probe Customization: Provides POGO PIN (spring probes) of various grades and specifications with matching PCR solutions.
Style Customization: Available structures include OPEN TOP SOCKET, push-down (or pressure-test) SOCKET, high-temperature dedicated SOCKET, etc.
Cycle Life Customization: Options for high, medium and low cycle life to suit R&D, pilot or mass production stages.
Precision Design: Uses precision structures such as HARD STOP to ensure even force distribution on IC and avoid damage.
Expedited Service: Offers SUPER HARD RUN fast-track service for urgent project demands.
After-Sales Support: 7×24-hour free design consultation with firm commitments on lead time and quality.
Specifications
Product Type Key Features Application Scenarios
Burn-in Socket Customized service, OPEN TOP structure, high durability Ideal for long-time programming, compatible with automated programming equipment
CSP Burn-in Socket Customized service, OPEN TOP structure, precision design Specially designed for small, fragile CSP package IC
IC Test Socket Customized service, fast response Suitable for short-time, high-frequency testing, compatible with automated test equipment
High-Temperature Test Socket Customized service, OPEN TOP structure, high-temperature resistant materials For long-term high-temperature environment testing and burn-in
Related Products
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