Hilo Semiconductor (Xuzhou) Co., Ltd.
Home - Product Center - Optical Inspection - Package InspectionHL-640 Die Bond / Wire Bond Fully Automatic Optical Inspection System

IC Programming equipment · IC Programming equipment

IC Programming equipment · IC Programming equipment

HL-640 Die Bond / Wire Bond Fully Automatic Optical Inspection System

Package Inspection

HL-640 Die Bond / Wire Bond Fully Automatic Optical Inspection System
describe
The HL-640 is a high-performance fully automatic optical inspection system designed for IC packaging processes, integrating appearance defect inspection for both Die Bond and Wire Bond, two critical packaging steps. Equipped with dual high-speed cameras and AI learning algorithms, plus an adaptive smart track, it accurately identifies various packaging defects to enable automated quality screening on production lines.
Key Highlights
AI Learning Capability: Intelligent learning algorithm understands normal process variations, accurately identifies real defects, and improves inspection stability and accuracy.
Dual-Camera Inspection Platform: Equipped with two independent high-speed imaging systems (5MP & 25MP), supporting simultaneous or sequential inspection for higher efficiency.
Adaptive Smart Track: Automatic width adjustment supports various leadframe/substrate sizes, enabling fast changeover for multi-product production.
Comprehensive Defect Coverage: Automatically detects wire bonding issues, poor solder joints, die shift, lead deformation, contamination and other packaging defects.
Full Automation Workflow: Integrated auto loading/unloading, dual-station inspection and report generation for unmanned operation from input to sorting.
Intelligent Inspection Management Platform
Specifications
Category Item Specification
Mechanical Dimensions (W×D×H) 1600 × 1050 × 1420 mm
Weight 1170 kg
Power Voltage 220V AC
Rated Power 2500W (to be confirmed)
Motion System Travel Range X-cam: 100mm / Track: 1000mm
Y: 100mm
Z: 12mm
Stage Size 100 × 300 mm
Max. Speed X: 50 mm/s
Y: 30 mm/s
Z: 5 mm/s
Resolution X/Y: 1μm
Z: 0.5μm
Positioning Accuracy X/Y: ±2μm
Z: ±1μm
Z Repeatability ±1μm
Vision System Camera 5MP & 25MP high-resolution cameras
Lens Magnification 1X / 2X optional
FOV Max: 5.2 × 3.8 mm
High-res: 3.1 × 2.3 mm
Pixel Resolution Up to 0.775μm/pixel
Core Software Platform HILO System
Inspection Process Coverage Die Bond, Wire Bond
Defect Types Missing wire, poor bond, die shift, lead deformation, contamination, IC scratch, tail abnormality, broken wire, etc.
Automation Handling Auto load-in, dual-station inspection, auto unload & sorting
Related Products
If you would like to learn more about the value our products can create,
please feel free to contact us at any time.
Our team of experts will address your questions one by one.
Copyright © HiloMax Semiconductor (Xuzhou) Co., Ltd.. All rights reserved Powered by Bomin