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HV-256 MCU Tester

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HV-256 MCU Tester is an efficient and accurate automated testing solution specifically designed for microcontrollers. It features high-speed testing capability and high-precision electrical parameter measurement, widely compatible with various MCU architectures and interfaces, providing users with reliable guarantee from R&D validation to mass production testing, and significantly improving testing efficiency and product quality.

Key Highlights

Wide Device Compatibility: Supports multiple core architectures including ARM, RISC-V, 8051 and rich interface types, easily meeting diverse MCU test requirements.

High-Speed Testing Capability: Equipped with high-speed digital channels and processing units, greatly shortening functional test and scan time and improving production throughput.

High-Precision Parameter Measurement: Integrated precision measurement unit (PMU) provides microamp-level current and millivolt-level voltage measurement accuracy, ensuring accurate and reliable electrical parameter testing.

Stable and Reliable Operation: Designed specifically for 7×24-hour production line environments, with excellent long-term stability and consistency to ensure trouble-free continuous production.

Intelligent Automated Process: Features a user-friendly interface and automated test sequence functions, simplifying operation and reducing reliance on senior technical personnel.

MCU R&D Functional and Performance Verification

Suitable for chip design companies and R&D laboratories to conduct comprehensive functional verification, performance benchmarking and limit parameter testing for new-model MCUs.
MCU Mass Production Final Test (FT) and Sorting

Ideal for final test in assembly and test factories. With high-speed testing capability and stable performance, it quickly completes chip yield screening and grading.
Embedded Module and Finished Board Testing

Applicable to downstream manufacturing requiring in-circuit programming (ICP) or functional diagnosis of on-board MCUs, ensuring the core control unit of modules or finished products functions properly.

Intelligent Test Development & Production Management Platform

Automated Test Project Management: Features a graphical test flow editor for creating, saving and executing complex multi-step automated test sequences (Auto Run), enabling one‑click full test startup.
Advanced Debug & Diagnostic Tools: Integrates real‑time data monitoring, waveform display and memory viewer for fast issue identification and shorter debug cycles in R&D.
Intelligent Data Analysis & Reporting: Automatically generates detailed test reports with statistics, yield analysis, distribution charts and customizable export for quality decision support.
Open Programming Environment: Supports standard development environments and scripting languages for flexible custom test algorithm development and import, with high scalability.

Specifications

Item	Description
Model	HV-256 MCU Tester
Core Application	Automated testing for microcontrollers (MCUs)
Test Features	High-speed testing, high-precision electrical parameter measurement
Key Compatibility	Supports various MCU architectures (ARM, RISC‑V, etc.) and common interfaces
Core Advantages	High speed, high precision, wide compatibility, stable and reliable
Software Functions	Automated test flows, user-friendly UI, complete report generation & export
Related Equipment	ICT-192 NOR/NAND Tester