Memory Test Equipment - NOR/NAND Flash Tester - CP/FT Test

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Test Equipment

ICT-192 NOR/NAND Tester

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ICT-192 is a high-performance, high-precision testing solution specifically designed for NOR/NAND Flash memory IC. It integrates comprehensive testing functions including Logic, PMU, VPP, VCC and HT tests, providing full-process support from R&D verification to mass production testing. With excellent testing accuracy and flexibility, it ensures the quality and reliability of memory IC.

Key Highlights

Comprehensive Test Capability: One system integrates logic test, precision measurement unit (PMU), programming voltage (VPP), core voltage (VCC) and high-temperature (HT) test, fully meeting all parameter test requirements for memory IC.

Ultra-High Test Precision: Voltage resolution down to 0.3mV and current resolution at nA level, ensuring accurate detection of tiny electrical defects and precise parameter trimming.

Powerful Channel Configuration: Supports up to 192 digital channels and multiple independent precision analog channels, enabling multi-IC parallel testing and complex interface support to boost test efficiency.

In-Depth Functional & Durability Test: Supports functional verification in both user mode and test mode, and provides cycle test function to evaluate IC endurance and long-term reliability.

Open Programming Environment: Supports ITE programming environment, allowing customers to develop or import test programs independently and generate customized data reports, flexibly adapting to various production and data analysis workflows.

Memory IC R&D and Characterization Analysis

Ideal for IC design verification stage. With high-precision PMU and VCC/VPP test capabilities, it accurately measures DC parameters, read/write power consumption and voltage margins for IC characterization.
Flash Memory Mass Production Test

Suitable for final test (FT) of NOR/NAND Flash. High-speed logic test and multi-site parallel capability enable efficient, full-coverage functional test and yield screening.
IC Reliability Verification and Quality Monitoring

Designed for QA and reliability teams. Combining HT test with cycle test, it simulates long-term operation under extreme temperatures for failure analysis and quality lifetime evaluation.

IC Test Development & Data Analytics Platform (ITE-Based)

ITE-Based Open Programming Environment: Built on industry-standard ITE (Integrated Test Environment), allowing users to flexibly develop, debug and import custom test algorithms and complex flows for deep, precise test coverage tailored to IC characteristics.
Efficient Test Program Development & Debug Tools: Integrated powerful code editor, compiler and real-time debugger with advanced features including waveform display, memory viewer and variable monitoring, enabling fast test program development and issue diagnosis to significantly shorten test solution development cycles.
Intelligent Mass Production Test Management: Intuitive graphical production interface supporting multi-site parallel test control, lot management, real-time yield and progress monitoring. Flexible binning rules and one-click generation of customized test reports and statistics.
Comprehensive Data Analysis & SPC Monitoring: Built-in high-performance data analytics engine for statistical analysis of large test datasets, automatically generating histograms, trend charts and Shmoo plots. Integrated real-time SPC (Statistical Process Control) monitors critical parameter variations for preventive quality management.
Flexible Automation & System Integration: Supports linkage with probers, handlers, temperature chambers and peripherals via standard interfaces (GPIB, Ethernet) to build automated test stations. Seamless MES integration for test data upload and production command download.

Specifications

Core Hardware Test Specifications
Test Module	Channels	Voltage Range	Voltage Resolution (Force/Measure)	Current Range	Current Resolution (Force/Measure)	Others
Logic Test	128 (Max 192)	0 ~ 4V	0.305 mV	-	-	Freq: 133MHz
PMU Test	16	-1.5V ~ +4V	0.343mV / 0.381mV	±5uA ~ ±10mA	0.172nA~343nA / 0.170nA~339nA	Mode: FV/MV/FI/MI/FN
VPP Test	16	-1.5V ~ +12V	0.343mV / 0.381mV	15uA ~ +80mA	0.172nA~2.77uA / 0.170nA~2.73uA	Mode: FV/MV/FI/MI/FN
VCC Test	16	-1.5V ~ +5V	0.343mV / 0.381mV	15uA ~ +298mA	0.172nA~10.2uA / 0.170nA~10.1uA	Mode: FV/MV/FI/MI/FN

HT Test & Advanced Functions
Function Category	Description
DC Test	Supports Open/Short/Leakage/Standby Current and other DC parameter tests.
Functional Test	Supports IC functional verification in User Mode and Test Mode (via HV pin).
Trim	Supports current and voltage trimming to ensure test accuracy.
Data Logging	Logs process data including pgm/erase polling time, current, voltage, etc.
Cycle Test	Supports endurance cycle testing by count or time.
Reporting & Programming	Custom-format reporting and ITE programming environment for customer-developed test programs.